Experımental Study of Metrologıcal Parameters of Qualıty Control
( Pp. 87-93)

More about authors
Isgandarzada Elchin B. doktor tehnicheskih nauk, professor; Laureat Gosudarstvennoy Premii po literature «Kyzyl Kelme», Zasluzhennyy pedagog Azerbaydzhanskoy Respubliki, Pochetnyy deyatel kultury Azerbaydzhanskoy Respubliki, Pochetnyy uchenyy Evropy, posol kultury UNESCO; zaveduyuschiy kafedroy «Metrologii i standartizacii»
Azerbaijan Technical University
Baku, Republic of Azerbaijan Valiyev G.S. doktorant, assistent
Azerbaijan Technical University
Baku, Republic of Azerbaijan Ahmadli Sh.V. doktorant, starshiy prepodpvatel
Azerbaijan Technical University
Baku, Republic of Azerbaijan Islamova U.R. doktorant
Azerbaijan Technical University
Baku, Republic of Azerbaijan
For read the full article, please, register or log in
Abstract:
The article discusses the rational use of all types of resources at the enterprise; improving the quality of management decisions; mastering innovative technologies; increasing labor productivity; improving product quality; the possibility of unpredictable processing and waste of products using models built on the use of S-charts, aimed at timely and high-quality order fulfillment. Estimation of the probable parameters of the model of the metrological support system allows to reduce the costs and time for process control, reduce the cost of production, as well as effectively distribute labor, material and financial resources.
How to Cite:
Isgandarzada E.B., Valiyev G.., Ahmadli S.., Islamova U.., (2021), EXPERIMENTAL STUDY OF METROLOGICAL PARAMETERS OF QUALITY CONTROL. Computational Nanotechnology, 2: 87-93. DOI: 10.33693/2313-223X-2021-8-2-87-93
Reference list:
ISO 9001-2008 Sistemy menedzhmenta kachestva. Trebovaniya . M.: Standartinform, 2008. 26 s.
Granaturov V.M. Organizatsiya, planirovanie i upravlenie metrologiicheskim obespecheniem. M.: Radio i svyaz , 2007. 184 s.
Pal chun YU.A. i dr. Matematicheskie modeli sistem menedzhmenta kachestva predpriyatiy // Aktual nye problemy metrologii: Mater. mezhdunar. nauchno-tekhn. konf. Novosibirsk, 2014. S. 305-312.
Silaev M.A., Bryantsev S.F. Prilozhenie matrits i grafov k analizu SVCH-ustroystv. M.: Radio i svyaz , 2000. 128 s.
Isgandarzada E.B., Ahmadli Sh.V., Valiyev H.S. Complex shape detal s 3D-model s in the Hexagon Tigo SF 05.06.05 machine for metrological support PS DMIS CAD program performance // Science and Education : Materials of the XII International Research and Practice Conference, July 1-2, 2016. Munich, Germany, 2016. Pp. 82-88.
ISO 9004-4-1993 Upravlenie kachestvom i elementy sistemy kachestva . CH. 4: Rukovodyashchie ukazaniya po uluchsheniyu kachestva.
Isikava K. YAponskie metody upravleniya kachestvom / per. s angl. M.: Ekonomika, 1998. 286 s.
Mezhdunarodnye standarty ISO serii 9000 na sistemy kachestva: versii 2000. M.: Izd-vo standartov, 2005. 56 s.
Mittag I., Rinne X. Statisticheskie metody obespecheniya kachestva / per. s nem.; pod. red. B.N. Markova. M.: Mashinostroenie, 2005. 340 s.
Osipov YU.I. i dr. Upravlenie kachestvom v mashinostroenii. M.: Nauka, 2009. 399 s.
SHindovskiy E., SHyurts O. Statisticheskie metody upravleniya kachestvom / per. s angl. M.: Mir, 2006. 598 s.
SHonberger R. YAponskie metody upravleniya proizvodstvom / per. s angl. M.: Ekonomika, 2008. 219 s.
Burhan F. Yavas. A comprasion on the quality perceptions of U.S. and firms the elektroniks industry // Management Int. Rev. 2005. Vol. 36. No. 2. Pr. 171-178.
Howland R. Testing a key part of manufacturing processing // Automation and Control. 2000. No. 7. Pp. 27-31.
Jaran J., Gruna F. Quality control: Handbook. New York, 2008. Pp. 54-56.
Quality street may be a dead end // Management Decis. 2004. Vol. 32. No. 5. Pp. 12-13.
TSentral nyy nauchno-issledovatel skiy institut mashinostroeniya. URL: http://new.tsniimash.ru/main.php id 127
Izd-vo mashinostroeniya. ZHurnal Vestnik mashinostroeniya . URL: http://www.mashin.ru/
Vestnik YUzhno-Ural skogo gosudarstvennogo universiteta. URL: http://vestnik.susu.ac.ru/
Keywords:
graphic models, coordinate metrology, deviations, quality indicators, metrological support system, probabilistic parameters, identification algorithm.